HIOKI ST5680A เครื่องทดสอบคุณภาพแบตเตอรี่ DC Hipot Tester

• Output voltage: 0.010 kV DC to 8.000 kV (1 V resolution)
• Output setting accuracy: ±20 V (below 3 kV, no load), ±0.4 % of setting ±8 V (3 kV and above, no load)
• Output/cutoff current: Max. 20 mA (test voltage 50 V or higher)
• Current accuracy: ±1.5% rdg. (typ., see instruction manual or brochure for details)
• Minimum resolution: 0.001 µA
• Test time: 0.1 s to 999 s, continuous (timer OFF)
• Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, OFF
• Test modes: W to IR, IR to W, Program test

• Output voltage: 10 V DC to 2000 V (1 V resolution)
• Output setting accuracy: ±20 V (no load)
• Resistance display range: 100.0 kΩ to 200.0 GΩ (0.01 kΩ resolution)
• Accuracy guarantee range: 100.0 kΩ to 99.99 GΩ
• Resistance accuracy: ±1.5% rdg. (see instruction manual or brochure for detailed range‑wise accuracy)
• Test time: 0.1 s to 999 s, continuous (timer OFF)
• Voltage rise/fall time: 0.1 s to 300 s / 0.1 s to 300 s, OFF

• Test methods: Continuous voltage rise test, Stepped voltage rise test
• Measurement: Insulation breakdown voltage (kV), Insulation breakdown strength (kV/mm)
• Settings: Start voltage, End voltage, Rise speed, Arc detection, Electrode distance, Upper limit current

• Waveforms: Voltage, Current, Insulation resistance
• Sampling rate: Max. 500 kS/s
• Display length: 0.5 s to 128 s (9 steps)
• Memory capacity: 512 k words

• Detection method: Monitoring of test‑voltage fluctuations
• Setting range: Test‑voltage variability 1% to 50%

• Detection method: Capacitance‑measurement method
• Setting range: Threshold (capacitance) setting 1.0 nF to 100.0 nF

• Waveform / graph save:
Destination: USB memory
Formats: BMP, PNG, CSV

• Panel memory:
DC hipot/IR: up to 64 sets each
BDV test: up to 10 sets
Program test: up to 30 programs (max. 50 steps)

• Data memory:
Up to 32,000 measured values

• PASS, FAIL (UPPER FAIL, LOWER FAIL)
• Judgment output via EXT. I/O and communication

• Interlock: links output enable/disable with external safety devices
• Automatic discharge: internal discharge after testing (residual voltage 30 V or less)
• Voltage limitation:upper‑limit control from 0.010 kV to 8.000 kV
• Auto range: automatic range switching based on measured values
• Panel memories: store and recall test conditions
• Self‑check/Key lock/Command monitor/I/O HANDLER test